Sep 23 – 27, 2024
ESRF Auditorium
Europe/Paris timezone

SNAPRed: A tool for data reduction and instrument calibration for the SNAP high-pressure diffractometer.

Sep 24, 2024, 6:15 PM
45m
Hybrid event (ESRF Auditorium)

Hybrid event

ESRF Auditorium

EPN Campus ESRF - ILL 71 Av. des Martyrs, 38000 Grenoble
Poster Data Reduction Posters

Speaker

Michael Walsh (ORNL)

Description

The SNAP diffractometer at SNS is highly re-configurable, featuring movable detectors, choppers, and optional neutron optics, introducing challenges in automated data reduction. The complexities of this data orchestration necessitated the development of the ongoing SNAPRed software. SNAPRed addresses this by defining unique Instrument States based on the instrumental configuration. A streamlined workflow for rapid, standardized calibration, accompanied by metrics for calibration quality, is a key feature. Pressure cells (“containers”) impact background and attenuation with wavelength-dependent effects. SNAPRed integrates existing approaches to manage these challenges. User experience (UX) is prioritized, balancing accessibility for novices with advanced controls for experts. Performance is optimized to support real-time Rietveld analysis by the end user, supported by a “lite” mode for faster data processing without loss of diffraction resolution. The software standardizes the reduction workflow, capturing all parameters, metadata, and processes for complete provenance of the reduced data.

Abstract publication I agree that the abstract will be published on the web site

Primary author

Malcolm Guthrie (ORNL)

Co-authors

Andrei Savici (ORNL) Michael Walsh (ORNL) Pete Peterson (ORNL)

Presentation materials

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